Zirconia Ceramic Surface Components for Semiconductor Packaging & Testing Equipment | Precision ZrO₂
Zirconia Ceramic Surface Components for Semiconductor Packaging & Testing Equipment | Precision ZrO₂
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Zirconia Ceramic Surface Components for Semiconductor Packaging & Testing Equipment | Precision ZrO₂ Parts
Customization:
Available
Terms of Payment:
LC, T/T
OEM/ODM:
available
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Essential details
Shipping:Express Delivery
Specification Number:SN001Al2O3037
Product Introduction

Zirconia Ceramic Surface Components for Semiconductor Packaging & Testing Equipment | Precision ZrO₂ Parts


High-purity zirconia ceramic surface components for semiconductor assembly and test equipment. Excellent wear resistance, low particle generation, and high dimensional stability for cleanroom environments.


  • zirconia ceramic semiconductor components

  • ceramic parts for semiconductor equipment

  • ZrO2 packaging test equipment components

  • low particle ceramic surface parts

  • semiconductor cleanroom ceramic components

  • wear resistant ceramic parts semiconductor


Product Overview

Zirconia ceramic surface components for semiconductor packaging and testing equipment are engineered to meet the stringent requirements of cleanroom environments. Manufactured from high-performance zirconia (ZrO₂), these parts offer excellent wear resistance, low particle generation, and superior dimensional stability, making them ideal for high-precision semiconductor assembly and test processes.


Key Features

1. Low Particle Generation
Minimizes contamination risk in semiconductor cleanroom operations.

2. Excellent Wear Resistance
Maintains surface integrity under repeated contact and mechanical stress.

3. High Dimensional Stability
Ensures precision and repeatability in semiconductor equipment.

4. Chemical Resistance
Compatible with cleaning agents and process chemicals.

5. Non-Metallic & Non-Contaminating
Ideal for sensitive semiconductor manufacturing environments.


Applications

  • Semiconductor packaging and testing equipment

  • Wafer handling and positioning systems

  • Surface contact components in assembly machines

  • Precision fixtures and support parts

  • Cleanroom automation systems


Technical Advantages

  • Reduced defect risk due to low contamination

  • Long service life under high-cycle operation

  • Stable performance in cleanroom conditions

  • Suitable for high-precision semiconductor processes


Customization Options

  • Surface geometry and contact design

  • Surface roughness control (Ra for particle reduction)

  • Dimensional tolerances for precision equipment

  • Integration with metal or polymer assemblies

  • OEM production based on drawings


Localized Title (US)

Zirconia Ceramic Components for Semiconductor Packaging & Test Equipment | USA Cleanroom Parts Supplier

Localized Content Snippet

We supply precision zirconia ceramic components for semiconductor packaging and testing equipment across the United States. Our parts are designed for low particle generation, high wear resistance, and stable performance in cleanroom environments.

OEM customization and engineering support available.


🔹 CTA

  • Request a Custom Semiconductor Component Quote

  • Submit Equipment Drawings

  • Contact Our Engineering Team


Material Characteristics Table

Type
Unit
A-100
A‑200
A‑300
AZ‑100
Material
-Al₂O₃ 97%
Al₂O₃ 99.5%
Al₂O₃ 99.7%
Al₂O₃‑ZrO₂
Colour
-
White ivoryWhite
Ivory White
White
Density
g/cm³
3.75
3.9
3.92
4.2
Flexural Strength
MPa
280
320
370
480
Compressive Strength
MPa
2250
2300
2450
2700
Modules of Elasticity
GPa
330
370
380
350
Fracture Toughness
MPa·m^½
3
4
4.5
5.5
Poisson's Ratio

0.23
0.22
0.22
0.24
Hardness
HRA
90
91
91
91
Vickers Hardness
HV1
1450
1550
1600
1600
Thermal Expansion
10⁻⁶K⁻¹
7.1
6.8
6.8
9.2
Thermal Conductivity
W/m·K
25
32
32
8
Thermal Shock
ΔT·℃
200
220
220
470
Max Use Temp(Oxidizing)

1200
1400
1650
1000
Max Use Temp(Reducing)

1200
1400
1700
1000
Volume Resistivity (20℃)
Ω·cm
10¹⁴
10¹⁵
10¹⁵
10¹⁴
Dielectric Strength
kV/mm
16
20
22
16.5
Dielectric Constant(1MHz)
-11.5111011
Dielectric Loss (tanδ)
1MHz
3×10⁻³
1×10⁻³
1×10⁻³
2×10⁻²

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